Spatially-localized X-ray scattering and X-ray microtomography measurements on Moso bamboo

dc.contributor.affiliationUniversity of Helsinki-Svedström, Kirsi
dc.contributor.authorSvedström, Kirsi
dc.date.accessioned2025-04-29T13:59:34Z
dc.date.issued2017-01-09
dc.date.issued2017-01-09
dc.descriptionSpatially-localized X-ray scattering and X-ray microtomography measurements on Moso bamboo   This data set is originally used in: Ahvenainen, P., Dixon, P. G., Kallonen, A., Suhonen, H., Gibson, L. J., & Svedström, K. (2017). Spatially-localized bench-top X-ray scattering reveals tissue-specific microfibril orientation in Moso bamboo. Plant Methods. 13:5 DOI: 10.1186/s13007-016-0155-1 This data set includes measurements on Moso bamboo (Phyllostachys edulis) performed with two separate set-ups at the Department of Physics, University of Helsinki as described in the above open-access publication. The X-ray microtomography (XMT) measurements, X-ray diffraction tomography (XDT) and localized X-ray scattering (LXS) are done with set-up 1. In LXS, the region-of-interest is selected from a tomographic reconstruction slice based on the XMT measurement using a small X-ray beam (diameter: 200 µm). Additional wide-angle X-ray scattering (WAXS) measurements are conducted with set-up 2 using a larger X-ray beam (diameter approx. 1 mm).  The two-dimensional scattering patterns (Pilatus 1M hybrid pixel array detector) and tomographic reconstruction slices obtained with set-up 2 are stored as TIFF-images (.tif). The two-dimensional scattering patterns (MAR345 image plate detector) obtained with set-up 2 are stored as 32-bit RAW files (unsigned integers, 2300 columns, 2300 rows).  The novel combined WAXS/XMT set up (set-up 1) is first presented in: Suuronen, J.-P., Kallonen, A., Hänninen, V., Blomberg, M., Hämäläinen, K., & Serimaa, R. (2014). Bench-top X-ray microtomography complemented with spatially localized X-ray scattering experiments. Journal of Applied Crystallography, 47(1), 471–475. doi:10.1107/S1600576713031105 Any queries related to the data set or the related Plant Methods article may be directed to the first author by email: Patrik Ahvenainen, PhD; patrik.ahvenainen@alumni.helsinki.fi
dc.identifierhttps://doi.org/10.5281/zenodo.60046
dc.identifier.urihttps://datakatalogi.helsinki.fi/handle/123456789/4360
dc.rights.licensecc-by-4.0
dc.subjectX-ray microtomography
dc.subjectWide-angle X-ray scattering
dc.subjectMoso bamboo
dc.subjectLocalised X-ray scattering
dc.subjectX-ray diffraction tomography
dc.titleSpatially-localized X-ray scattering and X-ray microtomography measurements on Moso bamboo
dc.typedataset
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